DocumentCode :
3118660
Title :
A Time and Frequency Measurement Technique Based on Length Vernier
Author :
Zhou, Hui ; Zhou, Wei
Author_Institution :
Dept. of Meas. & Instrum., Xidian Univ., Xi´´an
fYear :
2006
fDate :
38869
Firstpage :
267
Lastpage :
272
Abstract :
A simple length vernier approach has been developed which uses the high stability and high speed of signal transmission and the relation of time and space. It can get high resolution, low cost and simple structure. Based on high stable transmission delay of the signal and the coincidence detection technique, the start and stop signals of a measured short time interval are delayed respectively in the different lines. The line length to transmit the start signal is longer than that of the stop signal according to the measurement resolution, and both of the lines are divided into small subsections according to the measuring precision. Both active and passive device can be used for delay lines, but passive device can get higher resolution and has special problems that need be resolved. Based on the position of the coincidence between two signals, their delay difference can be used to express the measured time interval exactly. With this way, the measurement precision is much better than that of the unit subsection of the two delay lines for start and stop signals. This technique can show much finer than ns resolution and even better in the future. The different delay lines can be used here including coaxial cable, PC board, and even in integrated circuit
Keywords :
delay lines; frequency measurement; signal processing; time measurement; PC board; active device; coaxial cable; coincidence detection; delay lines; frequency measurement; integrated circuit; length vernier; passive device; signal transmission delay; time measurement; Coaxial cables; Costs; Delay effects; Delay lines; Frequency measurement; Length measurement; Position measurement; Signal resolution; Stability; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
Type :
conf
DOI :
10.1109/FREQ.2006.275393
Filename :
4053771
Link To Document :
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