DocumentCode
3118709
Title
Estimating the reliability of Lawrence Livermore National Laboratory (LLNL) flash X-ray (FXR) machine
Author
Ong, Mike M. ; Kihara, Ron ; Zentler, Jan M. ; Kreitzer, Blake R. ; DeHope, William J.
Author_Institution
Lawrence Livermore National Lab, PO Box 808, Mail Stop L-153 Livermore, CA, USA
Volume
2
fYear
2007
fDate
17-22 June 2007
Firstpage
1078
Lastpage
1081
Abstract
At Lawrence Livermore National Laboratory (LLNL), our flash X-ray accelerator (FXR) is used on multi-million dollar hydrodynamic experiments. Because of the importance of the radiographs, FXR must be ultra-reliable. Flash linear accelerators that can generate a 3 kA beam at 18 MeV are very complex. They have thousands, if not millions, of critical components that could prevent the machine from performing correctly. For the last five years, we have quantified and are tracking component failures. From this data, we have determined that the reliability of the high-voltage gas-switches that initiate the pulses, which drive the accelerator cells, dominates the statistics. The failure mode is a single-switch pre-fire that reduces the energy of the beam and degrades the X-ray spot-size. The unfortunate result is a lower resolution radiograph.
Keywords
Degradation; Hydrodynamics; Laboratories; Particle beams; Power system reliability; Radiography; Statistics; Switches; Testing; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2007 16th IEEE International
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0913-6
Electronic_ISBN
978-1-4244-0914-3
Type
conf
DOI
10.1109/PPPS.2007.4652375
Filename
4652375
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