• DocumentCode
    3118709
  • Title

    Estimating the reliability of Lawrence Livermore National Laboratory (LLNL) flash X-ray (FXR) machine

  • Author

    Ong, Mike M. ; Kihara, Ron ; Zentler, Jan M. ; Kreitzer, Blake R. ; DeHope, William J.

  • Author_Institution
    Lawrence Livermore National Lab, PO Box 808, Mail Stop L-153 Livermore, CA, USA
  • Volume
    2
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1078
  • Lastpage
    1081
  • Abstract
    At Lawrence Livermore National Laboratory (LLNL), our flash X-ray accelerator (FXR) is used on multi-million dollar hydrodynamic experiments. Because of the importance of the radiographs, FXR must be ultra-reliable. Flash linear accelerators that can generate a 3 kA beam at 18 MeV are very complex. They have thousands, if not millions, of critical components that could prevent the machine from performing correctly. For the last five years, we have quantified and are tracking component failures. From this data, we have determined that the reliability of the high-voltage gas-switches that initiate the pulses, which drive the accelerator cells, dominates the statistics. The failure mode is a single-switch pre-fire that reduces the energy of the beam and degrades the X-ray spot-size. The unfortunate result is a lower resolution radiograph.
  • Keywords
    Degradation; Hydrodynamics; Laboratories; Particle beams; Power system reliability; Radiography; Statistics; Switches; Testing; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4652375
  • Filename
    4652375