• DocumentCode
    3118794
  • Title

    The Study of Spatial Selective Attention Effects by Event-Related Potentials

  • Author

    Wang, Meng ; Li, Ling ; Zhang, Jinxiang

  • Author_Institution
    Key Lab. for Neurolinformation of Minist. of Educ., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    18-20 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The effects of visuospatial selective attention on information processing have been investigated by means of high-density event-related brain potentials (ERP) while the subjects were instructed to covertly attend to one side of the visual field with fixation on the center of the screen. Previous studies have demonstrated the attention-related modulation of the P1 (scalp-positive waves from 90-130 ms) and N1 (scalp-negative waves from 160-200 ms) component of ERP recorded from the occipital scalp areas contralateral to the direction of attention. In our study, the additional modulation of the amplitude of P2 component (scalp-positive waves from 220-260 ms) indicates that not only the short-latency early ERP component was affected by spatial attention, but also the late component is modulated, thus it can serve as proof supporting late selection theory.
  • Keywords
    bioelectric potentials; brain; electroencephalography; neurophysiology; psychology; EEG; attention-related modulation; high-density event-related brain potentials; information processing; occipital scalp areas; scalp-negative waves; scalp-positive waves; selection theory; short-latency early ERP component; spatial selective attention effects; time 200 ms to 160 ms; time 220 ms to 260 ms; time 90 ms to 130 ms; visuospatial selective attention; Amplitude modulation; Delay; Educational technology; Enterprise resource planning; Laboratories; Magnetic resonance imaging; Positron emission tomography; Scalp; Spatial resolution; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedical Engineering (iCBBE), 2010 4th International Conference on
  • Conference_Location
    Chengdu
  • ISSN
    2151-7614
  • Print_ISBN
    978-1-4244-4712-1
  • Electronic_ISBN
    2151-7614
  • Type

    conf

  • DOI
    10.1109/ICBBE.2010.5516336
  • Filename
    5516336