Title :
Pulsed internal-node waveform study of flip-chip MMIC power amplifiers
Author :
Bao, J.W. ; Wei, C.J. ; Hwang, J.C.M. ; Wang, R.F. ; Wen, C.P.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Abstract :
A pulsed internal-node microwave waveform probing technique was developed and used to characterize flip-chip MMIC power amplifiers. Variations in load impedances were found across the band and different unit cells.
Keywords :
MMIC power amplifiers; flip-chip devices; integrated circuit measurement; integrated circuit testing; microwave measurement; waveform analysis; IC testing; flip-chip MMIC power amplifiers; load impedances; microwave amplifiers; microwave waveform probing technique; pulsed internal-node waveform; unit cells; Impedance; MMICs; Microwave amplifiers; Operational amplifiers; Power amplifiers; Probes; Pulse amplifiers; Pulse generation; Pulse measurements; Testing;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.602946
