• DocumentCode
    3119125
  • Title

    A simple, low resistance contact system for shallow junction p+nn+ InP solar cells that preserves emitter integrity during sintering

  • Author

    Fatemi, N.S. ; Weizer, V.G. ; Wilt, D.M. ; Hoffman, R.W.

  • Author_Institution
    Essential Res. Inc., Cleveland, OH, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    5-9 Dec 1994
  • Firstpage
    2129
  • Abstract
    We have discovered what appears to be a unique contact system for use on p-type InP. The new contacts provide low resistance contact to p-InP without the violent metallurgical intermixing that would normally take place between the emitter material and the contact metallization during the contact sintering process. With this new contact system it is possible, for the first time, to make low resistance ohmic contact directly to a shallow junction p/n InP solar cell without destroying the cell in the process. The use of this contact system eliminates the need for an InGaAs cap layer under the metallization, greatly facilitating the use of low cost substrates
  • Keywords
    III-V semiconductors; indium compounds; ohmic contacts; p-n junctions; semiconductor device metallisation; sintering; solar cells; InP; contact metallization; emitter integrity; low cost substrates; low resistance contact system; ohmic contact; shallow junction p+nn+ InP solar cells; sintering; Contact resistance; Costs; Indium gallium arsenide; Indium phosphide; Metallization; Neural networks; Photovoltaic cells; Substrates; Temperature; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    0-7803-1460-3
  • Type

    conf

  • DOI
    10.1109/WCPEC.1994.521642
  • Filename
    521642