DocumentCode :
3119398
Title :
The Restricted Isometry Property for block diagonal matrices
Author :
Yap, Han Lun ; Eftekhari, Armin ; Wakin, Michael B. ; Rozell, Christopher J.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2011
fDate :
23-25 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
In compressive sensing (CS), the Restricted Isometry Property (RIP) is a powerful condition on measurement operators which ensures robust recovery of sparse vectors is possible from noisy, undersampled measurements via computationally tractable algorithms. Early papers in CS showed that Gaussian random matrices satisfy the RIP with high probability, but such matrices are usually undesirable in practical applications due to storage limitations, computational considerations, or the mismatch of such matrices with certain measurement architectures. To alleviate some or all of these difficulties, recent research efforts have focused on structured random matrices. In this paper, we study block diagonal measurement matrices where each block on the main diagonal is itself a Gaussian random matrix. The main result of this paper shows that such matrices can indeed satisfy the RIP but that the requisite number of measurements depends on the coherence of the basis in which the signals are sparse. In the best case-for signals that are sparse in the frequency domain-these matrices perform nearly as well as dense Gaussian random matrices despite having many fewer nonzero entries.
Keywords :
Gaussian processes; frequency-domain analysis; matrix algebra; random processes; signal reconstruction; Gaussian random matrices; block diagonal measurement matrices; frequency domain; measurement architectures; restricted isometry property; sparse vectors recovery; structured random matrices; Coherence; Frequency domain analysis; Noise measurement; Random variables; Sensors; Sparse matrices; Vectors; Block Diagonal Matrices; Compressive Sensing; Restricted Isometry Property;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Sciences and Systems (CISS), 2011 45th Annual Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9846-8
Electronic_ISBN :
978-1-4244-9847-5
Type :
conf
DOI :
10.1109/CISS.2011.5766142
Filename :
5766142
Link To Document :
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