• DocumentCode
    3119764
  • Title

    Author index

  • fYear
    2004
  • fDate
    22-25 March 2004
  • Firstpage
    309
  • Lastpage
    312
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on
  • Conference_Location
    Awaji Yumebutai, Japan
  • Print_ISBN
    0-7803-8262-5
  • Type

    conf

  • DOI
    10.1109/ICMTS.2004.1309502
  • Filename
    1309502
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3119764