DocumentCode
3119831
Title
ADEV Calculated from Phase Noise Measurements and Its Possible Errors Due to FFT Sampling
Author
Chang, Po-Cheng ; Chen, Shang-Shian ; Lin, Shinn-Yan
Author_Institution
National Stand. Time & Frequency Lab., Chunghwa Telecom Co. Ltd., Taipei
fYear
2006
fDate
38869
Firstpage
587
Lastpage
590
Abstract
In this paper, we show that fast Fourier transform (FFT) sampling plays an important role in the calculation of Allan deviation (ADEV) while using the numerical integration as a tool for the time and frequency (T&F) conversion. In order to avoid generation of unreasonable ADEV values, FFT sampling data are re-generated with logarithmic frequency space using an interpolation skill. Therefore, results from both the numerical integration and the power-law processes could match each other quite well. Besides, spurs in spectral density have non-neglectful influences upon ADEV results. For example, when the data of our lab´s phase noise measurement system are processed, the ADEV generated from the spectral density with spurs may reach to three times the one while spurs are removed
Keywords
electric noise measurement; fast Fourier transforms; phase noise; spectral analysis; time measurement; time-frequency analysis; ADEV; Allan deviation; FFT sampling; fast Fourier transform; interpolation skill; logarithmic frequency space; numerical integration; phase noise measurement; power-law process; spectral density; time-frequency conversion; Cutoff frequency; Density measurement; Fast Fourier transforms; Frequency conversion; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Sampling methods; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location
Miami, FL
Print_ISBN
1-4244-0074-0
Electronic_ISBN
1-4244-0074-0
Type
conf
DOI
10.1109/FREQ.2006.275452
Filename
4053830
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