Title :
ADEV Calculated from Phase Noise Measurements and Its Possible Errors Due to FFT Sampling
Author :
Chang, Po-Cheng ; Chen, Shang-Shian ; Lin, Shinn-Yan
Author_Institution :
National Stand. Time & Frequency Lab., Chunghwa Telecom Co. Ltd., Taipei
Abstract :
In this paper, we show that fast Fourier transform (FFT) sampling plays an important role in the calculation of Allan deviation (ADEV) while using the numerical integration as a tool for the time and frequency (T&F) conversion. In order to avoid generation of unreasonable ADEV values, FFT sampling data are re-generated with logarithmic frequency space using an interpolation skill. Therefore, results from both the numerical integration and the power-law processes could match each other quite well. Besides, spurs in spectral density have non-neglectful influences upon ADEV results. For example, when the data of our lab´s phase noise measurement system are processed, the ADEV generated from the spectral density with spurs may reach to three times the one while spurs are removed
Keywords :
electric noise measurement; fast Fourier transforms; phase noise; spectral analysis; time measurement; time-frequency analysis; ADEV; Allan deviation; FFT sampling; fast Fourier transform; interpolation skill; logarithmic frequency space; numerical integration; phase noise measurement; power-law process; spectral density; time-frequency conversion; Cutoff frequency; Density measurement; Fast Fourier transforms; Frequency conversion; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Sampling methods; Time measurement;
Conference_Titel :
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0074-0
Electronic_ISBN :
1-4244-0074-0
DOI :
10.1109/FREQ.2006.275452