• DocumentCode
    3119884
  • Title

    Improving the classification accuracy in electronic noses using multi-dimensional combining (MDC)

  • Author

    Chen, Hong ; Goubran, Rafik A. ; Mussivand, Tofy

  • Author_Institution
    Dept. of Syst. & Comput. Eng., Carleton Univ., Ottawa, Ont., Canada
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    587
  • Abstract
    Traditional pattern recognition (PARC) methods, used in electronic noses (e-noses) are either parametric (such as k-nearest neighbors, KNN, and linear discriminant analysis, LDA) or non-parametric (such as artificial neural network and fuzzy logic). Multi-dimensional combining (MDC) is proposed to combine the classification outputs of individual classifiers into a more robust and accurate one. Two implementations are proposed to find the individual classifiers, one is based on various feature extraction methods and the other is based on various dimension reduction methods, with three means of combining. Six household fragrances were sampled using the Cyranose 320 e-nose device. The acquired data (600 measurements) was split into two sets, training and testing. Experiments were conducted at various concentrations of the sample smell, various sample numbers and various training numbers. Results show the advantage of MDC over the individual classifiers, and over the other traditional PARC methods under all conditions.
  • Keywords
    electronic noses; feature extraction; multidimensional signal processing; neural nets; pattern classification; Cyranose 320; KNN; LDA; artificial neural network; classification accuracy; dimension reduction methods; e-noses; electronic noses; feature extraction methods; fuzzy logic; k-nearest neighbors; linear discriminant analysis; multidimensional combining; multidimensional signal processing; nonparametric methods; parametric methods; pattern recognition methods; probabilistic neural network; Chemical analysis; Electronic noses; Feature extraction; Humans; Instruments; Linear discriminant analysis; Pattern recognition; Robustness; Signal processing algorithms; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2004. Proceedings of IEEE
  • Print_ISBN
    0-7803-8692-2
  • Type

    conf

  • DOI
    10.1109/ICSENS.2004.1426233
  • Filename
    1426233