DocumentCode
3119965
Title
Automatic Assessment of Voice Quality According to the GRBAS Scale
Author
Saenz-Lechon, Nicolas ; Godino-Llorente, Juan I. ; Osma-Ruiz, Victor ; Blanco-Velasco, Manuel ; Cruz-Roldan, Fernando
Author_Institution
Dept. de Ingenieria de Circuitos y Sistemas, Univ. Politecnica de Madrid
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
2478
Lastpage
2481
Abstract
Nowadays, the most extended techniques to measure the voice quality are based on perceptual evaluation by well trained professionals. The GRBAS scale is a widely used method for perceptual evaluation of voice quality. The GRBAS scale is widely used in Japan and there is increasing interest in both Europe and the United States. However, this technique needs well-trained experts, and is based on the evaluator´s expertise, depending a lot on his own psycho-physical state. Furthermore, a great variability in the assessments performed from one evaluator to another is observed. Therefore, an objective method to provide such measurement of voice quality would be very valuable. In this paper, the automatic assessment of voice quality is addressed by means of short-term Mel cepstral parameters (MFCC), and learning vector quantization (LVQ) in a pattern recognition stage. Results show that this approach provides acceptable results for this purpose, with accuracy around 65% at the best
Keywords
cepstral analysis; diseases; psychology; speech; speech processing; speech recognition; vector quantisation; GRBAS scale; Mel cepstral parameters; acoustic analysis; evaluator expertise; learning vector quantization; organic pathologies; pattern recognition; perceptual evaluation; psycho-physical state; speech processing; voice quality automatic assessment; voice quality measurement; Circuits; Cities and towns; Convergence; Morphology; Pathology; Protocols; Psychoacoustic models; Psychology; Speech analysis; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260603
Filename
4462297
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