Thermal characterization of crystal ovens used in phase noise measurement system

Author

Sthal, F. ; Galliou, S. ; Abbé, P. ; Franquet, N. ; Vacheret, X. ; Salzenstein, P. ; Rubiola, E. ; Cibiel, G.

Author_Institution

FEMTO-ST Inst., Besancon

fYear

2006

fDate

38869

Firstpage

736

Lastpage

739

Abstract

In this paper, the thermal stability characterization of crystal ovens used in a phase noise measurement system of ultra-low noise crystal resonators is proposed. This bench is dedicated to test 5 MHz and 10 MHz crystal devices packaged in HC40 enclosures. New double ovens have been designed to improve the ultimate noise floor of our carrier suppression bench. A brief description of the temperature environment and processing are given. In addition, experiments to measure the thermal stability of the oven control are given. These new crystal ovens present an Allan standard deviation of about 2-10^-15 at 1 s in terms of relative frequency fluctuations

Keywords

crystal resonators; electric noise measurement; microwave ovens; phase noise; thermal stability; 1 s; 10 GHz; 5 GHz; Allan standard deviation; carrier suppression; crystal ovens; crystal resonators; phase noise measurement; thermal characterization; thermal stability; Frequency; Noise measurement; Ovens; Packaging; Phase measurement; Phase noise; Temperature; Testing; Thermal stability; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

International Frequency Control Symposium and Exposition, 2006 IEEE

Conference_Location

Miami, FL

Print_ISBN

1-4244-0074-0

Electronic_ISBN

1-4244-0074-0

Type

conf

DOI

10.1109/FREQ.2006.275480

Filename

4053858