• DocumentCode
    3120441
  • Title

    Study on wavelength distribution of high power laser diode array

  • Author

    Li, Shen ; Guofeng, Xin ; Zujie, Fang ; Ronghui, Qu

  • Author_Institution
    Lab. for Inf. Opt., Chinese Acad. of Sci., Shanghai, China
  • fYear
    2009
  • fDate
    13-17 July 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Measured lateral wavelength distribution of LDA is presented, showing typically a V-type feature. Analyses indicate it is induced by bonding stress. A linear distributed stress model is proposed to explain the experimental results.
  • Keywords
    semiconductor laser arrays; stress effects; bonding stress; high power laser diode array; lateral wavelength distribution; linear distributed stress model; Bonding; Diode lasers; Heat sinks; Linear discriminant analysis; Optical arrays; Sea measurements; Semiconductor laser arrays; Thermal stresses; Tin; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4102-0
  • Electronic_ISBN
    978-1-4244-4103-7
  • Type

    conf

  • DOI
    10.1109/OECC.2009.5217098
  • Filename
    5217098
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3120441