An application of multiple-valued logic to test case generation for software system functional testing

Author

Hu, Mou

fYear

2001

fDate

2001

Firstpage

35

Lastpage

40

Abstract

A multiple-valued input two-valued output logic system (MITOL) is proposed as a description language of software functionality for test case generation purpose. Based on the MITOL description of software functionality, test generation algorithms for multiple-valued logic circuits, such as path sensitization, can be used for test case generation for software system functional testing. The resulting minimum complete test set contains the minimum number of test cases to cover all logical stuck-at-faults. Finally, a comparison of this new method with traditional methods is presented

Keywords

formal verification; logic testing; multivalued logic circuits; program testing; description language; logical stuck-at-faults; minimum complete test set; multiple-valued input two-valued output logic system; multiple-valued logic; multiple-valued logic circuits; path sensitization; software functionality; software system functional testing; test case generation; test generation algorithms; Application software; Circuit testing; Computer aided software engineering; Logic circuits; Logic testing; Natural languages; Software algorithms; Software systems; Software testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Multiple-Valued Logic, 2001. Proceedings. 31st IEEE International Symposium on

Conference_Location

Warsaw

ISSN

0195-623X

Print_ISBN

0-7695-1083-3

Type

conf

DOI

10.1109/ISMVL.2001.924552

Filename

924552