• DocumentCode
    3120491
  • Title

    On the 1/f Frequency Noise in Ultra-Stable Quartz Oscillators

  • Author

    Rubiola, Enrico ; Giordano, Vincent

  • Author_Institution
    FEMTO-ST Inst., Besancon
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    759
  • Lastpage
    766
  • Abstract
    The frequency flicker of an oscillator, which appears as a 1/f3 line in the phase noise spectral density, and as a floor on the Allan deviation plot, originates from two basic phenomena, namely: (1) the 1/f phase noise turned into 1/f frequency noise via the Leeson effect, and (2) the 1/f fluctuation of the resonator natural frequency. The discussion on which is the dominant effect, thus on how to improve the stability of the oscillator, has been going on for years without giving a clear answer. This article tackles the question by analyzing the phase noise spectrum of several commercial oscillators and laboratory prototypes, and demonstrates that the fluctuation of the resonator natural frequency is the dominant effect. The investigation method starts from reverse engineering the oscillator phase noise in order to show that if the Leeson effect was dominant, the resonator merit factor Q would be too low as compared to the available technology
  • Keywords
    1/f noise; crystal oscillators; flicker noise; reverse engineering; 1/f noise; Allan deviation plot; Leeson effect; dominant effect; frequency flicker; phase noise spectral density; phase noise spectrum; quartz oscillators; resonator natural frequency; reverse engineering; 1f noise; Fluctuations; Frequency conversion; Laboratories; Oscillators; Phase noise; Prototypes; Resonant frequency; Space technology; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Frequency Control Symposium and Exposition, 2006 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    1-4244-0074-0
  • Electronic_ISBN
    1-4244-0074-0
  • Type

    conf

  • DOI
    10.1109/FREQ.2006.275484
  • Filename
    4053862