DocumentCode :
3120583
Title :
Can Testing Keep Up With Near-gigahertz Digital Circuits?
Author :
Saul, P. ; Gudger, K.
Author_Institution :
Plessey Research
fYear :
1991
fDate :
13-15 Feb. 1991
Firstpage :
80
Lastpage :
81
Keywords :
Built-in self-test; Circuit testing; Costs; Design for testability; Digital circuits; Frequency; Integrated circuit technology; Pattern analysis; Reliability engineering; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
Type :
conf
DOI :
10.1109/ISSCC.1991.689072
Filename :
689072
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3120583
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