• DocumentCode
    3120583
  • Title

    Can Testing Keep Up With Near-gigahertz Digital Circuits?

  • Author

    Saul, P. ; Gudger, K.

  • Author_Institution
    Plessey Research
  • fYear
    1991
  • fDate
    13-15 Feb. 1991
  • Firstpage
    80
  • Lastpage
    81
  • Keywords
    Built-in self-test; Circuit testing; Costs; Design for testability; Digital circuits; Frequency; Integrated circuit technology; Pattern analysis; Reliability engineering; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-87942-644-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.1991.689072
  • Filename
    689072
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3120583