Title :
On hysteresis in magnetic lenses of electron microscopes
Author :
van Bree, P.J. ; van Lierop, C.M.M. ; van den Bosch, P.P.J.
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
This paper deals with an experimental procedure to illustrate the problems introduced by ferromagnetic hysteresis present in magnetic lenses of electron microscopes. The magnetic flux density is not available as a measurable quantity. Hysteresis expresses itself in the relation between the input current applied to the lens-coil and the level of sharpness (defocus) of the resulting images. The familiar hysteresis loops are not available, instead we measure hysteresis in the so-called butterfly representation. The input-profiles are non-periodic and illustrate the difficulties with reproducibility in microscopy applications. Image based feedback control is impossible since 99% of the input range yield unusable images. Analysis of the experiments is carried out using a qualitative model consisting of an interconnection of hysteresis representing the magnetic lens and a nonlinear function representing electron optics. Because this model introduces the intermediate magnetic field variable, it is possible to reconstruct and explain the results observed in the experiments.
Keywords :
electron microscopes; feedback; hysteresis; magnetic lenses; nonlinear functions; butterfly representation; electron microscopes; electron optics; feedback control; ferromagnetic hysteresis; hysteresis loops; hysteresis measurement; magnetic flux density; magnetic lenses; nonlinear function; qualitative model; Current measurement; Lenses; Magnetic force microscopy; Magnetic hysteresis; Magnetic resonance imaging; Scanning electron microscopy;
Conference_Titel :
Industrial Electronics (ISIE), 2010 IEEE International Symposium on
Conference_Location :
Bari
Print_ISBN :
978-1-4244-6390-9
DOI :
10.1109/ISIE.2010.5637564