• DocumentCode
    3120730
  • Title

    Enabling robustness and flexibility of equipment data collection through SEMI EDA standards

  • Author

    Wang, Shaopeng ; Botros, Youssry ; Martin, James W.

  • Author_Institution
    LTD Autom., Intel Corp., Hillsboro, OR, USA
  • fYear
    2004
  • fDate
    4-6 May 2004
  • Firstpage
    165
  • Lastpage
    169
  • Abstract
    This paper addresses data collection mechanisms for factory automation systems. The two-fold purpose of this paper includes describing some of the key benefits of the Equipment Data Acquisition (EDA) interface being defined by SEMI and addressing challenges associated with migration to this interface. Before reviewing and addressing the contents of the emerging EDA standard we will detail problems, issues and deficiencies associated with the current data collection mechanism that we´ve experienced in Intel manufacturing automation systems. These problems can be attributed to either lack of robustness or insufficient flexibility. Then, we proceed by summarizing the contents, and benefits of the emerging EDA standard.
  • Keywords
    access protocols; data acquisition; factory automation; standards; Intel manufacturing systems; SEMI EDA standards; access protocols; data collection mechanisms; equipment data acquisition; factory automation systems; Control systems; Data acquisition; Electronic design automation and methodology; Fault detection; Manufacturing automation; Personal communication networks; Process control; Production facilities; Robustness; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop
  • Print_ISBN
    0-7803-8312-5
  • Type

    conf

  • DOI
    10.1109/ASMC.2004.1309558
  • Filename
    1309558