Title :
Issues In High-speed Clocking
Author :
Bidermann ; Jorgensen, J.
Author_Institution :
Digital Equipment Corp.
Keywords :
Circuit testing; Clocks; Delay; Frequency; Integrated circuit interconnections; Microprocessors; Network-on-a-chip; Packaging; Pressing; Solid state circuit design;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689074
