Title : 
Microfabrication procedure of PDMS microbeam array using photolithography for laminin printing and piconewton force transduction on axons
         
        
            Author : 
Sasoglu, F. Mert ; Bohl, Andrew J. ; Layton, Bradley E.
         
        
        
            fDate : 
Aug. 30 2006-Sept. 3 2006
         
        
        
        
            Abstract : 
The purpose of this paper is to introduce our design for transducing forces on the order of tens of piconewtons by optically measuring deflection of a microfabricated beam tip as it pulls on an array of flexible structures such as axons in an array of laminin-printed neurons. To achieve this we have designed polymeric beams with spring constants on the order of 10pN/mum. We have fabricated circular microbeams with Sylgardreg polydimethylsiloxane (PDMS). The elastic modulus of PDMS was determined experimentally using a microscale and a micrometer at different concentrations of curing agent and base agent and found to be on the order of 100 kPa. The designed geometry is a 100times100 tapered microcone array with each beam having a length of 100mum, and a base diameter of 10mum. A SU-8 negative photoresist is etched using photolithography and used as a mold for PDMS soft lithography. PDMS was injected into the mold and the array peeled from the mold
         
        
            Keywords : 
biomechanics; cellular biophysics; molecular biophysics; neurophysiology; photolithography; photoresists; polymers; proteins; PDMS microbeam array; SU-8 negative photoresist; Sylgard; axons; elastic modulus; laminin-printed neurons; microfabricated beam tip; neural array; photolithography; piconewton force transduction; polydimethylsiloxane; polymeric beams; Flexible structures; Force measurement; Lithography; Nerve fibers; Neurons; Optical arrays; Optical design; Optical polymers; Printing; Springs; Neural array; force transduction; microbeam;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
         
        
            Conference_Location : 
New York, NY
         
        
        
            Print_ISBN : 
1-4244-0032-5
         
        
            Electronic_ISBN : 
1557-170X
         
        
        
            DOI : 
10.1109/IEMBS.2006.260311