DocumentCode :
3121783
Title :
Silicon carbide power devices: hopeful or hopeless?
Author :
Johnson, C. Mark ; Wright, Nick G. ; Ortolland, Sylvie ; Morrison, Dominique ; Adachi, Kazuhiro ; O´Neill, Anthony
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle upon Tyne Univ., UK
fYear :
1999
fDate :
1999
Firstpage :
42644
Lastpage :
42648
Abstract :
Wide band gap semiconductors, such as SiC, GaN and diamond, offer the potential to overcome both the temperature and voltage blocking limitations of Si. In essence, the high voltage capability derives from the fact that the critical electric field of the material increases with band-gap whilst the high temperature capability derives from a reduction in intrinsic carrier concentration with increasing band-gap. The idealised, theoretical performance of a semiconductor material may be evaluated for a specific application using an appropriate figure of merit. Such comparisons typically yield figures showing improvements of orders of magnitude over conventional Si devices
Keywords :
silicon compounds; SiC; SiC power devices; critical electric field; figure of merit; high temperature capability; high voltage capability; intrinsic carrier concentration; temperature limitations; voltage blocking limitations; wide band gap semiconductors;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Recent Advances in Power Devices (Ref. No. 1999/104), IEE Colloquium on
Conference_Location :
London
Type :
conf
DOI :
10.1049/ic:19990600
Filename :
789950
Link To Document :
بازگشت