DocumentCode
3121790
Title
SystemC: a homogenous environment to test embedded systems
Author
Fin, Alessandro ; Fummi, Franco ; Martignano, Maurizio ; Signoretto, Mirko
Author_Institution
DST Inf., Univ. di Verona, Italy
fYear
2001
fDate
2001
Firstpage
17
Lastpage
22
Abstract
The SystemC language is becoming a new standard in the EDA field and many designers are starting to use it to model complex systems. SystemC has been mainly adopted to define abstract models of hardware/software components, since they can be easily integrated for rapid prototyping. However, it can also be used to describe modules at a higher level of detail, e.g., RT-level hardware descriptions and assembly software modules. Thus, it would be possible to imagine a SystemC-based design flow, where the system description is translated from one abstraction level to the following one by always using SystemC representations. The adoption of a SystemC-based design flow would be particularly efficient for testing purpose as shown in this paper. In fact, it allows the definition of a homogeneous testing procedure, applicable to all design phases, based on the same error model end on the same test generation strategy. Moreover, test patterns are indifferently applied to hardware and software components, thus making the proposed testing methodology particularly suitable for embedded systems. Test patterns are generated on the SystemC description modeling the system at one abstraction level, theta, they are used to validate the translation of the system to a lower abstraction level. New test patterns are then generated for the lower abstraction level to improve the quality of the test set and this process is iterated for each translation (synthesis) step
Keywords
embedded systems; formal specification; software prototyping; specification languages; RT-level hardware descriptions; SystemC language; abstract models; embedded systems testing; hardware/software components; homogenous environment; rapid prototyping; Embedded software; Embedded system; Hardware design languages; Pattern analysis; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Hardware/Software Codesign, 2001. CODES 2001. Proceedings of the Ninth International Symposium on
Conference_Location
Copenhagen
Print_ISBN
1-58113-364-2
Type
conf
DOI
10.1109/HSC.2001.924644
Filename
924644
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