• DocumentCode
    3121858
  • Title

    Electrical properties and microscopic structure of amorphous chalcogenides

  • Author

    Ielmini, D. ; Lacaita, A.L.

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2011
  • fDate
    7-9 Nov. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The quantitative description of conduction in amorphous chalcogenides is one of the major challenges in modeling phase change memory (PCM) devices. The disordered phase is characterized by a spatially dependent band-structure, which also changes with time driven by the spontaneous relaxation toward more energetically favorable configurations. The work reviews some recent models of amorphous conduction that, accounting for the essential features of this changing energy landscape and consistently explaining the experimental results as well as their statistical dependences.
  • Keywords
    chalcogenide glasses; electrical conductivity; amorphous chalcogenide; amorphous conduction; electrical conduction; energy landscape; microscopic structure; Amorphous semiconductors; Fluctuations; Numerical models; Phase change materials; Resistance; Solid modeling; Strontium; phase change materials; phase change memory; reliability modeling; resistance drift; structural relaxation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2011 11th Annual
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1428-3
  • Type

    conf

  • DOI
    10.1109/NVMTS.2011.6137101
  • Filename
    6137101