DocumentCode
3122081
Title
Finding Time-Lagged 3D Clusters
Author
Xu, Xin ; Lu, Ying ; Tan, Kian-Lee ; Tung, Anthony K H
Author_Institution
Nat. Univ. Hosp., Singapore
fYear
2009
fDate
March 29 2009-April 2 2009
Firstpage
445
Lastpage
456
Abstract
Existing 3D clustering algorithms on gene times sample times time expression data do not consider the time lags between correlated gene expression patterns. Besides, they either ignore the correlation on time subseries, or disregard the continuity of the time series, or only validate pure shifting or pure scaling coherent patterns instead of the general shifting and-scaling patterns. In this paper, we propose a novel 3D cluster model, S2D3 Cluster, to address these problems, where S2 reflects the shifting-and-scaling correlation and D3 the 3-Dimensional gene times sample times time data. Within the S2D3 Cluster model, expression levels of genes are shifting-and-scaling coherent in both sample subspace and time subseries with arbitrary time lags. We develop a 3D clustering algorithm, LagMiner, for identifying interesting S2D3 Clusters that satisfy the constraints of regulation (gamma), coherence (gamma), minimum gene number (MinG), minimum sample subspace size (MinS) and minimum time periods length (MinT). Experimental results on both synthetic and real-life datasets show that LagMiner is effective, scalable and parameter-robust. While we use gene expression data in this paper, our model and algorithm can be applied on any other data where both spatial and temporal coherence are pursued.
Keywords
biology computing; data mining; genetics; pattern clustering; LagMiner; correlated gene expression pattern; shifting-and-scaling correlation; time-lagged 3D clustering; Clustering algorithms; Coherence; Data engineering; Diseases; Gene expression; Hospitals; Robustness; Subspace constraints; 3d clusters; gene expression mining; microarray; time series; time-lagged;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Engineering, 2009. ICDE '09. IEEE 25th International Conference on
Conference_Location
Shanghai
ISSN
1084-4627
Print_ISBN
978-1-4244-3422-0
Electronic_ISBN
1084-4627
Type
conf
DOI
10.1109/ICDE.2009.80
Filename
4812425
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