DocumentCode
3122082
Title
BIST using pseudorandom test vectors and signature analysis
Author
Wang, Francis
Author_Institution
Tektronix Inc., Beaverton, OR, USA
fYear
1988
fDate
16-19 May 1988
Abstract
A tutorial is provided on a popular built-in self-test (BIST) scheme that uses pseudorandomly generated vectors as test stimuli and the signature-analysis technique to verify test results. The guidelines presented permit IC designers to implement the BIST method in their circuits using various design considerations and tradeoffs to achieve hardware efficiency and improved levels of controllability, observability, and testability
Keywords
integrated circuit testing; BIST method; built-in self-test; controllability; design considerations; guidelines; hardware efficiency; observability; pseudorandom test vectors; pseudorandomly generated vectors; signature analysis; testability; tradeoffs; tutorial; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Controllability; Data compression; Hardware; Integrated circuit testing; Observability; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/CICC.1988.20877
Filename
20877
Link To Document