DocumentCode :
3122547
Title :
Optimized Redundancy Selection Based On Failure-related Yield Model For 64Mb DRAM And Beyond
Author :
Kikuda, Shigeru ; Miyamoto, Hiroshi ; Mori, Shigeru ; Niiro, Mitsutaka ; Yarrada, M.
Author_Institution :
Mitsubishi Electric Corporation
fYear :
1991
fDate :
13-15 Feb. 1991
Firstpage :
104
Lastpage :
105
Keywords :
Circuit faults; Decoding; Electrical fault detection; Fabrication; Fault detection; Poisson equations; Random access memory; Redundancy; Semiconductor device modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
Type :
conf
DOI :
10.1109/ISSCC.1991.689082
Filename :
689082
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3122547
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