• DocumentCode
    3122618
  • Title

    The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces

  • Author

    Gianoli, Daniel J. ; Kohles, Sean S. ; Burnham, Nancy A. ; Clark, Melissa B. ; Brown, Christopher A. ; Kenealy, James N.

  • Author_Institution
    Dept. of Biomed. Eng., Worcester Polytech. Inst., MA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    5
  • Lastpage
    6
  • Abstract
    The preliminary data acquired for the roughness parameter (Ra) demonstrate that there is a clear difference between the 4 different surface preparations studied. Based on previous work it can be expected that once each sample has been seeded with cells, there will exist strong variations among the cellular activity on each disk surface. While it is not the goal of this project to quantify differences among the levels of cellular activity, it is believed that they can be inferred from differences in adhesive strength as well as visual differences among the images produced by the AFM. It is expected that differences in extracellular matrix production will be chiefly responsible for not only differences in cellular phenotypes among samples but also differences in adhesive strengths
  • Keywords
    atomic force microscopy; biomechanics; cellular biophysics; dentistry; orthopaedics; prosthetics; adhesive strength differences; cell seeding; cellular activity levels; cellular phenotypes differences; cytodetachment technique; dental implants; extracellular matrix production; implant surfaces; osteoblastic adhesion quantification; Adhesives; Atomic force microscopy; Biological materials; Biomedical engineering; Implants; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioengineering Conference, 2001. Proceedings of the IEEE 27th Annual Northeast
  • Conference_Location
    Storrs, CT
  • Print_ISBN
    0-7803-6717-0
  • Type

    conf

  • DOI
    10.1109/NEBC.2001.924692
  • Filename
    924692