Title :
Development of a compact magnetometer with an AC/DC magnetic field using HTS-SQUID
Author :
Takagi, Ryo ; Saari, Mohd Mawardi ; Sakai, Kenji ; Kiwa, Toshihiko ; Tsukada, Keiji
Author_Institution :
Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
Abstract :
Measuring the magnetic susceptibility of a material enable us to specify composition of the material. We have reported on development of a compact moving-sample magnetometer using high-temperature superconducting quantum interference device (HTS-SQUID). However, this magnetometer needs long time when we have to measure many samples. In order to solve this problem, we developed a compact magnetometer to analyze quantitative magnetic characteristics by our rapid measurement system using AC/DC functions. The optimal mounting position of pickup coils for the AC magnetic field measurement was optimized. The performance of the AC magnetic field measurement system was evaluated by measuring harmonic components of the AC magnetic response from a dispersion of iron oxide in styrene resin, when AC/DC magnetic field is applied. Using this system, the sample composition of ferromagnetic and diamagnetic substances can be evaluated from the mixed sample by measuring the harmonic components of the magnetic responses.
Keywords :
SQUIDs; high-temperature techniques; magnetic field measurement; magnetic fields; magnetometers; AC magnetic field measurement system; AC/DC magnetic field; HTS-SQUID; compact magnetometer; diamagnetic substances; ferromagnetic substances; harmonic components; high-temperature superconducting quantum interference device; magnetic susceptibility; optimal mounting position; pickup coils; quantitative magnetic characteristics; rapid measurement system; Coils; Magnetic field measurement; Magnetic fields; Magnetic susceptibility; Magnetometers; Materials; Superconducting magnets; high-Tc SQUID; magnetic susceptibility; magnetometer; nondestructive evaluation;
Conference_Titel :
Superconductive Electronics Conference (ISEC), 2013 IEEE 14th International
Conference_Location :
Cambridge, MA
Print_ISBN :
978-1-4673-6369-3
DOI :
10.1109/ISEC.2013.6604309