DocumentCode
3123036
Title
Reliability & failure analysis methodology of optoelectronics and its extendibility for future technologies
Author
Huang, Jia-Sheng
Author_Institution
Fiber Opt. Div., Emcore, Alhambra, CA, USA
fYear
2010
fDate
21-23 Sept. 2010
Firstpage
59
Lastpage
60
Abstract
We review the state-of-the-art reliability and failure analysis methodology of the optoelectronic devices. We will discuss the feasibility and extendibility of applying those established techniques to the future technologies such as nanotechnologies and renewable energies.
Keywords
failure analysis; integrated optoelectronics; laser reliability; nanophotonics; reviews; semiconductor lasers; wavelength division multiplexing; dense wavelength division multiplexing lasers; failure analysis; nanotechnology; optoelectronic device; reliability analysis; renewable energy; Distributed feedback devices; Failure analysis; Integrated circuit reliability; Nanoscale devices; Scanning electron microscopy; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Avionics Fiber-Optics and Photonics Technology Conference (AVFOP), 2010 IEEE
Conference_Location
Denver, CO
Print_ISBN
978-1-4244-5312-2
Electronic_ISBN
978-1-4244-5313-9
Type
conf
DOI
10.1109/AVFOP.2010.5637671
Filename
5637671
Link To Document