Title :
Reliability & failure analysis methodology of optoelectronics and its extendibility for future technologies
Author :
Huang, Jia-Sheng
Author_Institution :
Fiber Opt. Div., Emcore, Alhambra, CA, USA
Abstract :
We review the state-of-the-art reliability and failure analysis methodology of the optoelectronic devices. We will discuss the feasibility and extendibility of applying those established techniques to the future technologies such as nanotechnologies and renewable energies.
Keywords :
failure analysis; integrated optoelectronics; laser reliability; nanophotonics; reviews; semiconductor lasers; wavelength division multiplexing; dense wavelength division multiplexing lasers; failure analysis; nanotechnology; optoelectronic device; reliability analysis; renewable energy; Distributed feedback devices; Failure analysis; Integrated circuit reliability; Nanoscale devices; Scanning electron microscopy; Transmission electron microscopy;
Conference_Titel :
Avionics Fiber-Optics and Photonics Technology Conference (AVFOP), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-5312-2
Electronic_ISBN :
978-1-4244-5313-9
DOI :
10.1109/AVFOP.2010.5637671
