DocumentCode :
3123053
Title :
Fa: A System for Automating Failure Diagnosis
Author :
Duan, Songyun ; Babu, Shivnath ; Munagala, Kamesh
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC
fYear :
2009
fDate :
March 29 2009-April 2 2009
Firstpage :
1012
Lastpage :
1023
Abstract :
Failures of Internet services and enterprise systems lead to user dissatisfaction and considerable loss of revenue. Since manual diagnosis is often laborious and slow, there is considerable interest in tools that can diagnose the cause of failures quickly and automatically from system-monitoring data. This paper identifies two key data-mining problems arising in a platform for automated diagnosis called Fa. Fa uses monitoring data to construct a database of failure signatures against which data from undiagnosed failures can be matched. Two novel challenges we address are to make signatures robust to the noisy monitoring data in production systems, and to generate reliable confidence estimates for matches. Fa uses a new technique called anomaly- based clustering when the signature database has no high- confidence match for an undiagnosed failure. This technique clusters monitoring data based on how it differs from the failure data, and pinpoints attributes linked to the failure. We show the effectiveness of Fa through a comprehensive experimental evaluation based on failures from a production setting, a variety of failures injected in a testbed, and synthetic data.
Keywords :
Internet; data mining; digital signatures; failure analysis; fault diagnosis; pattern clustering; system monitoring; Internet service; anomaly-based clustering; automating failure diagnosis; data-mining problem; enterprise system; failure signature database; system-monitoring data; Clustering algorithms; Computer crashes; Computer science; Computerized monitoring; Condition monitoring; Costs; Data engineering; Databases; Partitioning algorithms; Production systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Engineering, 2009. ICDE '09. IEEE 25th International Conference on
Conference_Location :
Shanghai
ISSN :
1084-4627
Print_ISBN :
978-1-4244-3422-0
Electronic_ISBN :
1084-4627
Type :
conf
DOI :
10.1109/ICDE.2009.115
Filename :
4812473
Link To Document :
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