DocumentCode
3123183
Title
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
fYear
2004
fDate
17-20 May 2004
Abstract
The following topics are dealt with: circuit techniques to manage leakage & process variation; advanced memory device technology & SoC; advanced transistor structure, architectures & process; advanced metallization & interconnection; process induced damage; advanced VLSI design & power-leakage management; advanced memory reliability; advanced materials.
Keywords
integrated circuit design; integrated circuit technology; SoC; VLSI design; advanced materials; advanced memory device technology; advanced transistor structure; integrated circuit design; integrated circuit technology; interconnection; leakage variation; metallization; power-leakage management; process induced damage; process variation;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on
Conference_Location
Austin, TX, USA
Print_ISBN
0-7803-8528-4
Type
conf
DOI
10.1109/ICICDT.2004.1309880
Filename
1309880
Link To Document