Title :
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
Abstract :
The following topics are dealt with: circuit techniques to manage leakage & process variation; advanced memory device technology & SoC; advanced transistor structure, architectures & process; advanced metallization & interconnection; process induced damage; advanced VLSI design & power-leakage management; advanced memory reliability; advanced materials.
Keywords :
integrated circuit design; integrated circuit technology; SoC; VLSI design; advanced materials; advanced memory device technology; advanced transistor structure; integrated circuit design; integrated circuit technology; interconnection; leakage variation; metallization; power-leakage management; process induced damage; process variation;
Conference_Titel :
Integrated Circuit Design and Technology, 2004. ICICDT '04. International Conference on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-7803-8528-4
DOI :
10.1109/ICICDT.2004.1309880
