A precise 1/f noise spectroscopy setup for sensor characterization

Author

Kohl, Franz ; Beigelbeck, Roman ; Keplinger, Franz ; Jachimowicz, Artur ; Steurer, Johannes

Author_Institution

Res. Unit of Integrated Sensor Syst., Austrian Acad. of Sci., Austria

fYear

2004

fDate

24-27 Oct. 2004

Firstpage

1143

Abstract

We investigated the detection limit of a high-resolution modular instrumentation for current noise (1/f noise) spectroscopy. Rejecting amplifier noise as well as the thermal noise of two-pole resistive sensors (TPRS), the setup performs direct measurements of the power spectral density (PDS) of 1/f conductivity fluctuations of such TPRS. This enables the characterization of devices exhibiting very low current noise. Accordingly, expressions based on given measurement conditions are derived for the sensitivity and the accuracy of the method. These features are theoretically limited only by the time available for a measurement. The experimental results fully agree with theoretical predictions and confirm sub-thermal noise sensitivity along with high spectral resolution.

Keywords

1/f noise; correlation methods; electric noise measurement; electric sensing devices; spectral analysis; thermal noise; 1/f conductivity fluctuations; 1/f noise spectroscopy; TPRS; amplifier noise rejection; correlation based current noise spectroscopy; high-resolution modular instrumentation detection limit; low current noise devices; power spectral density measurements; sensor characterization; spectral resolution; subthermal noise sensitivity; thermal noise; two-pole resistive sensors; Conductivity measurement; Density measurement; Instruments; Performance evaluation; Power amplifiers; Sensor phenomena and characterization; Spectroscopy; Thermal conductivity; Thermal resistance; Thermal sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Sensors, 2004. Proceedings of IEEE

Print_ISBN

0-7803-8692-2

Type

conf

DOI

10.1109/ICSENS.2004.1426378

Filename

1426378