DocumentCode :
3123540
Title :
Capacitive distance control for measuring particulate magnetic media with magnetic force microscopy
Author :
Schwenk, J. ; Hug, H.J. ; Marioni, M.A. ; Hauet, T. ; Hehn, M. ; Araujo, F. Abreu ; Antohe, V.A. ; Srivastava, S.K. ; Piraux, L.
Author_Institution :
Nanoscale Mater. Sci., Swiss Fed. Labs. for Mater. Sci. & Technol., Dubendorf, Switzerland
fYear :
2015
fDate :
11-15 May 2015
Firstpage :
1
Lastpage :
1
Abstract :
It is challenging to precisely image magnetic structures in a context of pronounced topography. Tapping mode techniques have been developed to provide a practical solution to the need for magnetic characterization in these situations. By successively scanning the topography of the sample and its magnetic signal on a line-by-line basis, the sample´s inherent topography and most dust contamination can be dealt with, constituting a convenient method for the study of e.g. patterned media, or other small structures. But as research and development push the relevant dimensions downward, higher sensitivity and spatial resolution are required of the measurement. It thus becomes necessary to move to vacuum, whereby the cantilever sensitivity is increased and adhered water layers can be removed. Vacuum operation also facilitates low temperature measurements, which generally present stability advantages apart from the possibility of applying large magnetic fields. The quantitative evaluation of measurement data introduces a further constraint on the measurement, that the tip must not be modified between measurements.
Keywords :
magnetic force microscopy; magnetic particles; surface topography; capacitive distance control; dust contamination; magnetic force microscopy; magnetic structures; particulate magnetic media; topography; tpping mode techniques; Frequency measurement; Magnetic field measurement; Magnetic resonance imaging; Media; Pollution measurement; Surfaces; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7156676
Filename :
7156676
Link To Document :
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