• DocumentCode
    3124502
  • Title

    Signature Pattern Covering via Local Greedy Algorithm and Pattern Shrink

  • Author

    Kim, Hyungsul ; Im, Sungjin ; Abdelzaher, Tarek ; Han, Jiawei ; Sheridan, David ; Vasudevan, Shobha

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2011
  • fDate
    11-14 Dec. 2011
  • Firstpage
    330
  • Lastpage
    339
  • Abstract
    Pattern mining is a fundamental problem that has a wide range of applications. In this paper, we study the problem of finding a minimum set of signature patterns that explain all data. In the problem, we are given objects where each object has an item set and a label. A pattern is called a signature pattern if all objects with the pattern have the same label. This problem has many interesting applications such as assertion mining in hardware design and identifying failure causes from various log data. We show that the previous pattern mining methods are not suitable for mining signature patterns and identify the problems. Then we propose a novel pattern enumeration method which we call Pattern Shrink. Our method is strongly coupled with another novel method that is very similar to finding a local optimum with a negligible loss in performance. Our proposed methods show a speedup of more than ten times over the previous methods. Our methods are flexible enough to be extended to mining high confidence patterns, instead of signature patterns.
  • Keywords
    data mining; greedy algorithms; set theory; assertion mining; failure cause identification; hardware design; local greedy algorithm; pattern mining methods; pattern shrink; set covering; signature pattern covering; Algorithm design and analysis; Approximation algorithms; Approximation methods; Data mining; Greedy algorithms; Hardware; Search problems; Local Greedy Algorithm; Pattern Covering; Set Covering; Signature Mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining (ICDM), 2011 IEEE 11th International Conference on
  • Conference_Location
    Vancouver,BC
  • ISSN
    1550-4786
  • Print_ISBN
    978-1-4577-2075-8
  • Type

    conf

  • DOI
    10.1109/ICDM.2011.131
  • Filename
    6137237