• DocumentCode
    3124531
  • Title

    Optical simulation of a MOEMS based tuneable Fabry-Perot interferometer

  • Author

    Rubio, R. ; Sabate, N. ; Calaza, C. ; Santander, J. ; Fonseca, L. ; Gràcia, I. ; Cané, C. ; Moreno, M. ; Marco, S.

  • Author_Institution
    Centro Nacional de Microelectron. (IMB-CSIC), Spain
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    1324
  • Abstract
    Simulation of the optical response for a tuneable Fabry-Perot interferometer fabricated using silicon MOEMS (micro-opto-electromechanical system) technology is presented. This device, which is intended to be part of an NDIR (nondispersive infrared) system, is composed of two dielectric parallel mirrors; the upper mirror is a suspended structure, electrostatically actuated, that allows tuning of the length of the resonant cavity, and therefore selection of the wavelength region corresponding to a particular absorption band. As the final spectrum of the device is directly related to the planarity of the upper mirror, once validated with measurements in small areas of the surface of the device, the optical model is used to predict the response of the whole area of the interferometer. This allows us to estimate the effect of the planarity of the device on the resulting spectra.
  • Keywords
    Fabry-Perot interferometers; cavity resonators; electrostatic actuators; gas sensors; micromechanical devices; micromirrors; microsensors; optical sensors; silicon; absorption band; dielectric parallel mirrors; electrostatically actuated mirror; gas detection; micro-opto-electromechanical system; nondispersive infrared system; optical response; planarity; silicon MOEMS technology; tuneable Fabry-Perot interferometer; wavelength region selection; Area measurement; Dielectric devices; Electromagnetic wave absorption; Fabry-Perot interferometers; Mirrors; Optical devices; Optical interferometry; Optical tuning; Resonance; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2004. Proceedings of IEEE
  • Print_ISBN
    0-7803-8692-2
  • Type

    conf

  • DOI
    10.1109/ICSENS.2004.1426426
  • Filename
    1426426