Title :
Detecting external measurement disturbances based on statistical analysis for smart sensors
Author :
Dietrich, André ; Zug, Sebastian ; Kaiser, Jörg
Author_Institution :
Dept. of Distrib. Syst., Otto-von-Guericke-Univ. Magdeburg, Magdeburg, Germany
Abstract :
The transducer process of a sensor is interference-prone to environmental conditions or external disturbances depending on sensor type, measurement procedure etc. Dependable sensors are characterized by a broad independence of those factors or/and they can both detect situations that make a correct measurement impossible and validate the measurement result. In this paper we describe a statistical approach for the detection of faulty measurements caused by external disturbances. Our fault detection algorithm is based on a comparison of faultless reference measurements with current sensing values. Using this enhancement, a sensor becomes a real smart sensing device and supplies an additional validity estimation of each measurement. The approach was implemented and validated in a demonstration setup that integrates an infrared sensor array disturbed by a strong extraneous light.
Keywords :
intelligent sensors; statistical analysis; detecting external measurement disturbances; external disturbances; smart sensors; statistical analysis; transducer process; Fault detection; Fault tolerance; Intelligent sensors; Robot sensing systems; Sensor systems; Size measurement; Voltage measurement; disturbed sensor measurements; fault detection; non-parametric statistics; smart sensor;
Conference_Titel :
Industrial Electronics (ISIE), 2010 IEEE International Symposium on
Conference_Location :
Bari
Print_ISBN :
978-1-4244-6390-9
DOI :
10.1109/ISIE.2010.5637754