• DocumentCode
    3125324
  • Title

    Rank modulation for translocation error correction

  • Author

    Farnoud, Farzad ; Skachek, V. ; Milenkovic, O.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL, USA
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    2988
  • Lastpage
    2992
  • Abstract
    We consider rank modulation codes for flash memories that allow for handling arbitrary charge drop errors. Unlike classical rank modulation codes used for correcting errors that manifest themselves as swaps of two adjacently ranked elements, the proposed translocation codes account for more general forms of errors that arise in storage systems. Translocations represent a natural extension of the notion of adjacent transpositions and as such may be analyzed using related concepts in combinatorics and rank modulation coding. Our results include deriving the asymptotic capacity of translocation rank codes, construction techniques for asymptotically good codes and a simple decoding algorithm.
  • Keywords
    decoding; error correction codes; modulation coding; adjacent transposition notion; adjacently ranked element; arbitrary charge drop error; asymptotic capacity; combinatorics coding; decoding algorithm; flash memory; storage system; translocation error correction; translocation rank modulation code; Decoding; Error correction codes; Hamming distance; Measurement; Modulation; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory Proceedings (ISIT), 2012 IEEE International Symposium on
  • Conference_Location
    Cambridge, MA
  • ISSN
    2157-8095
  • Print_ISBN
    978-1-4673-2580-6
  • Electronic_ISBN
    2157-8095
  • Type

    conf

  • DOI
    10.1109/ISIT.2012.6284108
  • Filename
    6284108