DocumentCode
3125324
Title
Rank modulation for translocation error correction
Author
Farnoud, Farzad ; Skachek, V. ; Milenkovic, O.
Author_Institution
Dept. of Electr. & Comput. Eng., UIUC, Urbana, IL, USA
fYear
2012
fDate
1-6 July 2012
Firstpage
2988
Lastpage
2992
Abstract
We consider rank modulation codes for flash memories that allow for handling arbitrary charge drop errors. Unlike classical rank modulation codes used for correcting errors that manifest themselves as swaps of two adjacently ranked elements, the proposed translocation codes account for more general forms of errors that arise in storage systems. Translocations represent a natural extension of the notion of adjacent transpositions and as such may be analyzed using related concepts in combinatorics and rank modulation coding. Our results include deriving the asymptotic capacity of translocation rank codes, construction techniques for asymptotically good codes and a simple decoding algorithm.
Keywords
decoding; error correction codes; modulation coding; adjacent transposition notion; adjacently ranked element; arbitrary charge drop error; asymptotic capacity; combinatorics coding; decoding algorithm; flash memory; storage system; translocation error correction; translocation rank modulation code; Decoding; Error correction codes; Hamming distance; Measurement; Modulation; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Proceedings (ISIT), 2012 IEEE International Symposium on
Conference_Location
Cambridge, MA
ISSN
2157-8095
Print_ISBN
978-1-4673-2580-6
Electronic_ISBN
2157-8095
Type
conf
DOI
10.1109/ISIT.2012.6284108
Filename
6284108
Link To Document