DocumentCode :
3125345
Title :
A configurable CMOS voltage DAC for multichannel detector systems
Author :
Ericson, M.N. ; Frank, S.S. ; Britton, C.L., Jr. ; Emery, M.S. ; Sam, J.S. ; Wintenberg, A.L.
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fYear :
1997
fDate :
9-15 Nov 1997
Firstpage :
671
Abstract :
A CMOS voltage DAC has been developed for integration into multiple front-end electronics ASICs associated with the PHENIX detector located at the RHIC accelerator of Brookhaven National Laboratory. The topology allows wide-range output programmability by selection of an offset voltage and on-chip resistor and transistor sizing. The DAC is trimless and requires no external components, making it ideal for highly integrated collider detector systems. Errors associated with on-chip bias are minimized using a topology that implements a ratiometric relationship which compensates for absolute resistance value changes and is limited only by errors in the on-chip matching of MOSFETs and resistive devices. Temperature-induced errors associated with the integrated resistors are also minimized by the circuit topology and monolithic construction. All reference voltages and currents are derived using a single regulated voltage supply. This paper presents the general DAC architecture and design method, discusses on-chip matching issues and tradeoffs associated with device sizing and monolithic layout, and presents measured performance of various gate length DACs fabricated in a 1.2 μm CMOS process including integral nonlinearity, differential nonlinearity, and slope and offset errors
Keywords :
CMOS integrated circuits; detector circuits; digital-analogue conversion; nuclear electronics; DAC architecture; MOSFETs; PHENIX detector; RHIC accelerator; circuit topology; configurable CMOS voltage DAC; differential nonlinearity; integral nonlinearity; integrated resistors; monolithic construction; multichannel detector systems; multiple front-end electronics ASIC; offset errors; offset voltage; on-chip bias; on-chip matching; on-chip resistor; ratiometric relationship; resistive devices; slope errors; temperature-induced errors; topology; transistor sizing; trimless DAC; wide-range output programmability; Circuit topology; Design methodology; Detectors; Electron accelerators; Laboratories; Length measurement; MOSFETs; Resistors; Size measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1997. IEEE
Conference_Location :
Albuquerque, NM
ISSN :
1082-3654
Print_ISBN :
0-7803-4258-5
Type :
conf
DOI :
10.1109/NSSMIC.1997.672670
Filename :
672670
Link To Document :
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