• DocumentCode
    3125597
  • Title

    A feature-based approach to combine functional MRI, structural MRI and EEG brain imaging data

  • Author

    Calhoun, V. ; Adali, T. ; Liu, J.

  • Author_Institution
    Olin Neuropsychiatry Res. Center, Yale Univ., New Haven, CT
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    3672
  • Lastpage
    3675
  • Abstract
    The acquisition of multiple brain imaging types for a given study is a very common practice. However these data are typically examined in separate analyses, rather than in a combined model. We propose a novel methodology to perform joint independent component analysis across image modalities, including structural MRI data, functional MRI activation data and EEG data, and to visualize the results via a joint histogram visualization technique. Evaluation of which combination of fused data is most useful is determined by using the Kullback-Leibler divergence. We demonstrate our method on a data set composed of functional MRI data from two tasks, structural MRI data, and EEG data collected on patients with schizophrenia and healthy controls. We show that combining data types can improve our ability to distinguish differences between groups
  • Keywords
    biomedical MRI; data visualisation; electroencephalography; feature extraction; independent component analysis; medical image processing; sensor fusion; EEG brain imaging data; Kullback-Leibler divergence; data fusion; feature-based approach; functional MRI data; healthy controls; image modalities; joint histogram visualization technique; joint independent component analysis; schizophrenia; structural MRI data; Brain modeling; Computed tomography; Data visualization; Electric variables measurement; Electroencephalography; Enterprise resource planning; Independent component analysis; Low pass filters; Magnetic resonance imaging; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.259810
  • Filename
    4462595