• DocumentCode
    3125754
  • Title

    Noise and frequency analyses of a miniaturized 3-DOF accelerometer utilizing silicon nanowire piezoresistors

  • Author

    Dao, Dzung Viet ; Toriyama, Toshiyuki ; Sugiyama, Susumu

  • Author_Institution
    Center for Promotion of the 21st Century COE Program, Ritsumeikan Univ., Kyoto, Japan
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    1464
  • Abstract
    This paper presents the characterization of nanowire p-type Si piezoresistor, as well as the design of an ultra small 3-degree of freedom (3-DOF) accelerometer utilizing the nanowire Si piezoresistor. The investigation of silicon nanowire piezoresistor showed the longitudinal piezoresistance coefficient πl[011] of the Si nanowire piezoresistor increased up to 60% with a decrease in the cross sectional area, while transverse piezoresistance coefficient πt[011] decreased with an increase in the aspect ratio of the cross section. The sensitivity, noise, and frequency performance of the ultra small accelerometer using the silicon nanowires are carefully analyzed.
  • Keywords
    accelerometers; nanowires; piezoresistive devices; silicon; 3-degree of freedom; Si; aspect ratio; frequency analysis; longitudinal piezoresistance coefficient; miniaturized 3-DOF accelerometer; noise analysis; p-type Si piezoresistor; silicon nanowire piezoresistors; Accelerometers; Damping; Electrical resistance measurement; Frequency; Piezoresistance; Piezoresistive devices; Silicon; Surface resistance; Thermal resistance; Vehicle detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2004. Proceedings of IEEE
  • Print_ISBN
    0-7803-8692-2
  • Type

    conf

  • DOI
    10.1109/ICSENS.2004.1426463
  • Filename
    1426463