Title :
Noise and frequency analyses of a miniaturized 3-DOF accelerometer utilizing silicon nanowire piezoresistors
Author :
Dao, Dzung Viet ; Toriyama, Toshiyuki ; Sugiyama, Susumu
Author_Institution :
Center for Promotion of the 21st Century COE Program, Ritsumeikan Univ., Kyoto, Japan
Abstract :
This paper presents the characterization of nanowire p-type Si piezoresistor, as well as the design of an ultra small 3-degree of freedom (3-DOF) accelerometer utilizing the nanowire Si piezoresistor. The investigation of silicon nanowire piezoresistor showed the longitudinal piezoresistance coefficient πl[011] of the Si nanowire piezoresistor increased up to 60% with a decrease in the cross sectional area, while transverse piezoresistance coefficient πt[011] decreased with an increase in the aspect ratio of the cross section. The sensitivity, noise, and frequency performance of the ultra small accelerometer using the silicon nanowires are carefully analyzed.
Keywords :
accelerometers; nanowires; piezoresistive devices; silicon; 3-degree of freedom; Si; aspect ratio; frequency analysis; longitudinal piezoresistance coefficient; miniaturized 3-DOF accelerometer; noise analysis; p-type Si piezoresistor; silicon nanowire piezoresistors; Accelerometers; Damping; Electrical resistance measurement; Frequency; Piezoresistance; Piezoresistive devices; Silicon; Surface resistance; Thermal resistance; Vehicle detection;
Conference_Titel :
Sensors, 2004. Proceedings of IEEE
Print_ISBN :
0-7803-8692-2
DOI :
10.1109/ICSENS.2004.1426463