DocumentCode
3126102
Title
A note on the challenge of feature selection for image understanding
Author
Kinsman, Thomas B. ; Pelz, Jeff
Author_Institution
Multidiscipl. Vision Res. Lab., Rochester Inst. of Technol., Rochester, NY, USA
fYear
2013
fDate
22-22 Nov. 2013
Firstpage
26
Lastpage
30
Abstract
It is well known that using the correct features for pattern recognition is far more important than using a sophisticated classifier. A high order classifier, given inadequate features, will produce poor results. Low-level formed are combined to form mid-level features, which have much more discriminating power. Yet, the challenge of feature selection is often neglected in the literature. The literature often assumes that given N low-level features there are 2N-1 ways to use them, which significantly understates the challenge of finding the best features to use and the best ways to combine them. Basic low-level features (input measurements) must be combined in groups to construct features that are relevant for object recognition [1], yet the computational complexity of grouping measurements for input to a pattern recognition system makes the task very difficult. This paper discusses a method for quantifying the total number of ways to group a given number of low-level features for better understanding the feature selection problem.
Keywords
computational complexity; feature selection; image classification; object recognition; computational complexity; feature selection; grouping measurements; high order classifier; image understanding; object recognition; pattern recognition; Computer vision; Conferences; Correlation; Image color analysis; Pattern recognition; Sorting; Visualization; Feature Selection; Image Understanding; Pattern Recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing Workshop (WNYIPW), 2013 IEEE Western New York
Conference_Location
Rochester, NY
Print_ISBN
978-1-4799-3025-8
Type
conf
DOI
10.1109/WNYIPW.2013.6890984
Filename
6890984
Link To Document