DocumentCode :
3126392
Title :
Nanocrystalline fluxgate cores with transverse anisotropy
Author :
Ripka, P. ; Zaveta, K. ; Jurek, K.
Author_Institution :
Czech Tech. Univ., Praha, Czech Republic
fYear :
2004
fDate :
24-27 Oct. 2004
Firstpage :
1570
Abstract :
Fluxgate sensors with cores made of etched sheets can be processed by applying a strong magnetic field in the direction normal to the sheet plane in order to reduce the sensor noise. Magnetic domain structure was observed by SEM. The treatment resulted in 40% reduction of fluxgate sensor noise. This study was performed on nanocrystalline materials, but similar technique can be used to process some amorphous and crystalline alloys. This technology can improve the performance of microfluxgate sensors.
Keywords :
amorphous magnetic materials; fluxgate magnetometers; magnetic anisotropy; magnetic domains; magnetic fields; magnetic sensors; nanostructured materials; SEM; amorphous alloys; crystalline alloys; etched sheets; fluxgate sensor noise; magnetic domain structure; nanocrystalline fluxgate cores; nanocrystalline materials; strong magnetic field; Amorphous magnetic materials; Anisotropic magnetoresistance; Crystalline materials; Etching; Magnetic cores; Magnetic domains; Magnetic noise; Magnetic sensors; Nanostructured materials; Noise reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2004. Proceedings of IEEE
Print_ISBN :
0-7803-8692-2
Type :
conf
DOI :
10.1109/ICSENS.2004.1426490
Filename :
1426490
Link To Document :
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