DocumentCode :
3126562
Title :
An integrated design approach for self-validating fault tolerant smart sensors
Author :
Sharif, E. ; Richardson, A.M.D. ; Dorey, A.P.
Author_Institution :
Dept. of Eng., Lancaster Univ., UK
fYear :
1999
fDate :
36312
Firstpage :
42705
Lastpage :
42708
Abstract :
Microsystems used for safety critical applications require robust architectures to achieve satisfactory levels of reliability. The Integrated Diagnostic Reconfiguration (IDR) approach described may be adopted to produce a design that provides online diagnostic isolation and fault tolerance by continually reconfiguring analogue components within the device. Characteristic signal fluctuations are observed in the presence of a fault and these may be analysed to provide detection and identification of the faulty component. Once the fault has been isolated it is then possible to select the output from configurations that exclude the faulty component, potentially giving a useful result in the presence of component failure. The IDR concept is described using a Wheatstone bridge sensor interface circuit as an example. Laboratory results obtained from a working demonstrator are used to show how a fault may be accommodated in real time
Keywords :
intelligent sensors; CMOS sensor interface circuit; RISC microprocessor; Wheatstone bridge sensor interface circuit; characteristic signal fluctuations; integrated design approach; integrated diagnostic reconfiguration approach; interchangeable circuit blocks; interface ASIC; microsensors; mixed signal circuits; modular design; online diagnostic isolation; piezoresistive pressure sensor; reliability; robust architectures; safety critical applications; self-validating fault tolerant smart sensors; signal conditioning circuit;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on
Conference_Location :
Oxford
Type :
conf
DOI :
10.1049/ic:19990772
Filename :
790275
Link To Document :
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