DocumentCode
3127242
Title
International Electron Devices Meeting. Technical Digest (Cat. No.02CH37358)
fYear
2002
fDate
8-11 Dec. 2002
Abstract
Presents the front cover, front matter, and table of contents from the conference proceedings.
Keywords
semiconductor devices; CMOS devices; compound semiconductors; detectors; displays; electron devices; integrated circuit manufacturing; interconnect reliability; process technology; quantum electronics; sensors; simulation models; solid-state devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2002. IEDM '02. International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7462-2
Type
conf
DOI
10.1109/IEDM.2002.1175765
Filename
1175765
Link To Document