Author :
Gendai, Y. ; Komatsu, Y. ; Hirase, S. ; Kawata, M.
Author_Institution :
Sony Corporation
Keywords :
Capacitance; Clocks; Delay lines; Frequency; Jitter; Latches; Master-slave; Metastasis; Sampling methods; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689114
