Title :
Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
Abstract :
Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is analyzed and a read-noise target of less than 0.15 e-rms is suggested.
Keywords :
Poisson distribution; error statistics; image sensors; photon counting; D-log H characteristic; Poisson arrival statistics; dynamic range; imaging performance metrics; linearity; multibit quanta image sensors; overexposure latitude; photo-electron-counting quanta image sensors; read-noise target; read-noise-induced bit-error rate; single-bit quanta image sensors; Image sensors; Noise; Photodetectors; Photonics; Sensor phenomena and characterization; APS; Active pixel sensor; CIS; CMOS image sensor; Poisson statistics; QIS; binary pixel; low noise; multi-bit pixel; photoelectron counting; photon counting; quanta image sensor;
Journal_Title :
Electron Devices Society, IEEE Journal of the
DOI :
10.1109/JEDS.2013.2284054
