Title : 
A new effective imaging method with application in multiple frequency radar target recognition
         
        
            Author : 
Songhua, He ; Wenfeng, Sun ; Zaiqi, Lu
         
        
            Author_Institution : 
ATR Lab., Nat. Univ. of Defense Tech., Hunan, China
         
        
        
        
        
        
            Abstract : 
In this paper, a complex exponential model is used to describe the local partial Rayleigh or resonant response at first. Then the multiple frequency response equation of radar target is established. A FFT based strong scattering neighboring range area superresolution algorithm is used to obtain the so-called quasi-two-dimensional image of local spacial eigen-width vers radial range length. The imaging method is more effective than the conventional one-dimensional FFT algorithm which is used to obtain only range profile. Experimental data prove the effectiveness of the presented imaging method
         
        
            Keywords : 
Rayleigh channels; electromagnetic wave scattering; fast Fourier transforms; frequency response; image recognition; radar imaging; radar target recognition; scattering; FFT; complex exponential model; effective imaging; local partial Rayleigh response; local spacial eigen-width; multiple frequency radar target recognition; multiple frequency response equation; quasi-two-dimensional image; radial range length; resonant response; scattering neighboring range area superresolution algorithm; Electromagnetic scattering; Equations; Frequency; Frequency response; Image resolution; Optical scattering; Radar applications; Radar cross section; Radar imaging; Radar scattering; Rayleigh scattering; Resonance; Target recognition;
         
        
        
        
            Conference_Titel : 
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
         
        
            Conference_Location : 
Dayton, OH
         
        
        
            Print_ISBN : 
0-7803-2666-0
         
        
        
            DOI : 
10.1109/NAECON.1995.521909