Title :
Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications
Author :
Uchida, Ken ; Tanamoto, Tetsufumi ; Ohba, Ryuji ; Yasuda, Shin-ichi ; Fujita, Shinobu
Author_Institution :
Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan
Abstract :
We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.
Keywords :
large scale integration; low-power electronics; quantum cryptography; random number generation; single electron devices; ubiquitous computing; LSIs; RNG; cryptographic techniques; highly secure ubiquitous computing; low-power properties; random digital sequences; single-electron random-number generator; Circuit noise; Communication system security; Cryptography; Electron traps; Laboratories; Large scale integration; Modems; Sequences; Temperature; Ubiquitous computing;
Conference_Titel :
Electron Devices Meeting, 2002. IEDM '02. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7462-2
DOI :
10.1109/IEDM.2002.1175807
