Title :
An object-oriented approach for PC clusters
Author :
Soulaïmani, A. ; Wong, T. ; Azami, Y. ; Ali, A. Ben El Haj
Author_Institution :
University of Quebec
Keywords :
Documentation; Electrical capacitance tomography; Iterative methods; Process design; System testing; Unified modeling language;
Conference_Titel :
Parallel and Distributed Processing Symposium., Proceedings 15th International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7695-0990-8
DOI :
10.1109/IPDPS.2001.925178
