DocumentCode :
3128559
Title :
Broadband negative refraction at microwaves with a multilayered mushroom-type metamaterial
Author :
Yakovlev, A.B. ; Silveirinha, M.G. ; Kaipa, C.S.
Author_Institution :
Univ. of Mississippi, Oxford, MS, USA
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
In this paper, a multilayered mushroom-type structure is proposed as a bulk metamaterial, which creates a broadband negative refraction. The metamaterial is modeled using homogenization methods as a multilayered structure formed by a uniaxial wire medium loaded with periodic metallic elements (for example, patch arrays). It is shown that the phase of transmission coefficient decreases with the increasing incidence angle, resulting in the negative spatial shift of the transmitted wave. The homogenization model results are obtained with the uniform plane-wave incidence, and the full-wave CST results are generated with a Gaussian beam excitation, showing a strong negative refraction in a wide frequency band.
Keywords :
metamaterials; microwave materials; Gaussian beam excitation; broadband negative refraction; bulk metamaterial; full-wave CST; homogenization methods; homogenization model; incidence angle; microwaves; multilayered mushroom-type metamaterial; multilayered structure; negative spatial shift; patch arrays; periodic metallic elements; transmission coefficient; transmitted wave; uniaxial wire medium; uniform plane-wave incidence; wide frequency band; Frequency; Metamaterials; Microwave theory and techniques; Periodic structures; Telecommunications; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5516787
Filename :
5516787
Link To Document :
بازگشت