DocumentCode :
3128687
Title :
Trends in semiconductor packaging, a merchant house view
Author :
Test, Howard
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1988
fDate :
16-19 May 1988
Abstract :
Semiconductor packaging is being driven in two major directions by the demand for increased system operating speeds and higher functional density. Most prominent is the trend toward higher functional integration on the die, resulting in both a larger die size and decreased feature size. The other major trend is the mechanical integration of multiple devices in a single package. These trends require improved package-design methods that include electrical and thermomechanical modeling, improved data on material properties that drive package reliability, and novel methods of reliability testing to meet the very low defect levels that will be required in next-generation electronic equipment
Keywords :
VLSI; integrated circuit technology; packaging; reliability; VLSI; die size; feature size; functional density; material properties; mechanical integration of multiple devices; merchant house view; package reliability; package-design methods; reliability testing; semiconductor packaging trends IC packaging; system operating speeds; thermomechanical modeling; Assembly; Electronics packaging; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit reliability; Packaging machines; Semiconductor device packaging; Silicon; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 1988., Proceedings of the IEEE 1988
Conference_Location :
Rochester, NY
Type :
conf
DOI :
10.1109/CICC.1988.20919
Filename :
20919
Link To Document :
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